Atomic-Scale
Device Simulation Lab

Articles & Patents

Direct and defect-assisted electron tunneling through ultrathin SiO2 layers from first principles
Year of publication 2008
Title of paper Direct and defect-assisted electron tunneling through ultrathin SiO2 layers from first principles
Author Joon Goo Kang, Yong-Hoon Kim*, Junhyeok Bang, Kee-Joo Chang*
Publication in journal PHYSICAL REVIEW B
게재권(호) 77(19)
페이지 195321
Link 관련링크 https://journals.aps.org/prb/abstract/10.1103/PhysRevB.77.195321 1125회 연결
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