Atomic-Scale
Device Simulation Lab

Articles & Patents

Gate-versus defect-induced voltage drop and negative differential resistance in vertical graphene heterostructures
Year of publication 2022
Title of paper Gate-versus defect-induced voltage drop and negative differential resistance in vertical graphene heterostructures
Author Tae Hyung Kim, Juho Lee, Ryong-Gyu Lee, and Yong-Hoon Kim*
Publication in journal Npj Computational Materials
게재권(호) 8
페이지 50
Link 관련링크 https://doi.org/10.1038/s41524-022-00731-9 362회 연결
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