"Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors"

Zhujun Huang, Ryong-Gyu Lee, Edoardo Cuniberto, Jiyoon Song, Jeongwon Lee, Abdullah Alharbi, Kim Kisslinger, Takashi Taniguchi, Kenji Watanabe, Yong-Hoon Kim,* and Davood Shahrjerdi*

ACS Nano, 18(42), 28700-28711 (2024)

Media Coverage

NYU Press, Fall 2024 "Researchers at NYU Tandon and KAIST develop method to 'hear' defects in promising nanomaterial"