| Invited talk: "On the atomistic origins of random telegraph noises in 2D field-effect transistors" | |
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| Year of publication | 2025 |
| Title of paper | Invited talk: "On the atomistic origins of random telegraph noises in 2D field-effect transistors" |
| Author | Yong-Hoon Kim |
| Publication in journal | The 33rd international Conference on Defects in Semiconductors |
| 게재권(호) | 9(18) |
| 페이지 | |
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