HOME
Professor Current Members Alumni
Overview Theory & Computation Next-Generation Devices Quantum Materials Projects
Representative Articles Articles & Patents Invited Talks Presentations Gallery
Courses Wiki External
News Album Facilities Contact

Atomic-Scale
Device Simulation Lab

Gallery

Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors

작성일
24-10-24 13:49

  

등록된 댓글이 없습니다.

291 Daehak-ro, Yuseong-gu, Daejeon 305-701, Republic of Korea 카이스트 홈페이지 EE 홈페이지

Copyright (C) 2018, YHK Group, School of Electrical Engineering, KAIST, All Rights Reserved.