Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistor |
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| Year of publication | 2024 |
| Title of paper | Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistor |
| Author | Zhujun Huang, Ryong-Gyu Lee, Edoardo Cuniberto, Jiyoon Song, Jeongwon Lee, Abdullah Alharbi, Kim Kisslinger, Takashi Taniguchi, Kenji Watanabe, Yong-Hoon Kim*, and Davood Shahrjerdi* |
| Publication in journal | ACS Nano |
| 게재권(호) | 18 |
| 페이지 | 28700–28711 |
| Link |
https://pubs.acs.org/doi/10.1021/acsnano.4c06929
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